Jared Sagoff

Argonne National Laboratory
More from Jared Sagoff
Argonne materials scientist Andrew Ulvestad examines a sample at Argonne's Advanced Photon Source.
New X-ray Technique for Deformations
Materials scientists have developed a new X-ray technique to examine deformations and dislocations that affect material properties.
May 24th, 2017
This is a cross-section scanning electron microscopy image after hydrogen silsesquioxane patterning, sequential infiltration synthesis and removal of initiated chemical vapor deposition topcoat and organic components.
Self-Assembling Polymers Make Tiny Wires
Researchers developed a new way to create some of the world's thinnest wires.
Apr 12th, 2017