Infrared measurement adds important and often revealing data to certain types of R&D analysis, but it hasn’t always been easy to incorporate these measurements into experiments and reports. To close that gap, Fluke Corp. (Everett, WA) has introduced a new software feature that integrates high-resolution thermal data from the company’s TiX580, TiX560, TiX1000, TiX660, TiX640 and TiX620, infrared cameras with National Instruments’ LabVIEW and MathWorks’ MATLAB software, leveraging the strength of those powerful platforms and making it easy to add high-resolution infrared data, video and images to R&D analysis and reporting.
Once installed, the software allows continuous download of pixel-by-pixel, high-resolution radiometric data. R&D professionals can now use any of these six highest-resolution Fluke infrared cameras to thermally capture video and port the video data frame-by-frame into their MATLAB or LabVIEW software, and monitor it over time, identifying very small temperature changes that could indicate problems.
Additionally, the TiX580 Infrared Camera, the newest addition to the Fluke high-resolution line of cameras, features:
- 640 x 480 resolution for high measurement accuracy and an intuitive interface, making it easy to use for electronic design and validation, material science evaluations, and thermal modeling.
- A 240-degree rotating screen that allows R&D professionals to easily perform non-destructive testing over, under and around objects to preview and capture images with ease.