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Serial Standards Testing Expanded on Oscilloscopes

Third and four generation serial bus compliance testing brought to high fidelity oscilloscopes.

The DPO70000SX platform from Tektronix offers signal fidelity and performance coupled with a scalable architecture that offers room to grow as signal speeds continue to increase.
The DPO70000SX platform from Tektronix offers signal fidelity and performance coupled with a scalable architecture that offers room to grow as signal speeds continue to increase.
Tektronix

Tektronix (Beaverton, OR) is bringing support for serial bus standards testing to the new DPO70000SX family of ultra-high performance oscilloscopes. Featuring patented Asynchronous Time Interleaving (ATI) signal acquisition technology, the DPO70000SX platform offers signal fidelity and performance coupled with a scalable architecture that offers room to grow as signal speeds continue to increase. Additional features include: 

  • Serial bus test support for 4th generation standards, including USB3.1, Thunderbolt over USB Type-C, PCIe Gen4 and DDR4. 
  • Signal fidelity enabling precise margin analysis on 4th generation serial data rates beyond 10 Gb/sec. 
  • High bandwidth, low noise ATI channels for signal fidelity and measurement margins for today’s and tomorrow’s fastest signals.
  • A flexible architecture allowing units to be configured at the customer site to go from 23 GHz to 70 GHz with little downtime.
  • Triggering with 25 GHz edge trigger bandwidth.
  • High-precision time base that delivers accurate timing and jitter measurements.
  • An integrated counter/timer that enables high precision timing measurements to characterize designs and debug problems.

For more information, visit TEK.COM.

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