Patented RFID Tag Quality Measuring and Tracking

The technology is currently deployed in FineLine’s QCTrak application which collects, assesses, tracks and reports on RFID tag quality throughout the supply chain.

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FineLine Technologies (Norcross, GA) has announced that the United States Patent Office (USPTO) has issued Patent number US 9,652,733 B2 to FineLine Technologies for Systems and Methods for Measuring and Tracking Radio-Frequency Identification (RFID) Tags. The patent includes the systems and methods of input for various types of RFID data, such as chip and inlay type, scan location, encoding scheme and payload. It also measures and tracks the data of different users at various points throughout a supply chain, and stores it in a database. The data can then be analyzed to determine defects in RFID tag quality and help prevent or minimize costly reticketing further down the supply chain. 

The technology is currently deployed in FineLine’s QCTrak application. QCTrak collects, assesses, tracks and reports on RFID tag quality throughout the supply chain. As a ready-made compliance tool, QCTrak is configurable to each industry’s needs and can be cost effectively and easily implemented. QCTrak Mobile software uses existing smart devices with the addition of a UHF reader to scan, collect, inform and relay metrics to the Cloud. QCTrak Cloud aggregates this information and provides comprehensive analytical reports to help supply chain owners quickly identify potential tagging problems as product moves through the supply chain.

www.finelinetech.com; 800-500-8687

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