The new OmniScan X3 64 flaw detector delivers improved power and performance to Olympus’ (Waltham, MA) field-proven phased array ultrasonic testing (PAUT) product line. This 64-channel instrument has the pulser capacity to drive phased array (PA) probes with a larger number of elements, increasing the data acquisition speed for total focusing method (TFM) imaging. Users can exploit its increased capabilities to expand and diversify their application portfolio. Additionally:
- The high portability and enhanced performance of the OmniScan X3 64 flaw detector increase inspection productivity.
- It can process TFM images up to four times as fast as its predecessor, yet comes in the same rugged and easily transportable box.
- On job sites with limited or restricted space, users will appreciate that the OmniScan X3 64 unit is compact and less cumbersome than other 64-channel devices.
- Inspectors can also remain on site longer and perform bigger scanning jobs without transferring data, thanks to the large 1 TB onboard storage.
Facilitating complex and thick part or weld applications, the instrument’s full 64-element aperture PA and 128-element aperture TFM enables users to optimize advanced Dual Linear Array (DLA) and Dual Matrix Array (DMA) probes. Smaller defects are easier to distinguish using the OmniScan X3 64 flaw detector’s high-resolution PA and TFM imaging.