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Measurement System Designed for Metal Finishers

Precise control over the thickness of plated deposits.

The Bowman L Series desktop instrument was engineered for OEMs and contract shops who need precise control over the thickness of plated deposits.
The Bowman L Series desktop instrument was engineered for OEMs and contract shops who need precise control over the thickness of plated deposits.
Bowman

Bowman (Schaumburg, IL), a U.S. manufacturer of XRF coating measurement instruments, has introduced its large component L Series XRF for parts measuring up to 22" X 24" X 13". The Bowman L Series desktop instrument was engineered for OEMs and contract shops who need precise control over the thickness of plated deposits, preventing the quality issues that result from under-plating, and the cost consequences of over-plating. Additional features include:

  • The ability to determine the thickness of coatings within a broad range, from aluminum through uranium (13 through 92 on the periodic table).
  • The ability to measure up to five coating layers simultaneously.
  • A proprietary micro spot focus x-ray tube.
  • A temperature-stabilized silicon PIN diode detector β€” element peaks eliminate the need for secondary filters.
  • Minimal peak position drift assures stability over time and extends the interval between recalibrations.
  • A 4-position multiple collimator assembly β€” collimator sizes and focal distances can be tailored to the application.
  • A micro-focus video camera, synchronized with the x-ray optics, that pinpoints the target.
  • The ability to accommodate recessed areas and unusual part geometries.
  • Xralizer software to quantify coating thickness from the detected photons. 

For more information, call 847-781-3523, or visit www.bowmanxrf.com.

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