Semiautomated MarSurf Model XCR 20 takes both roughness and contour measurements. GD 25 roughness drive and PCV 200 contour drive mechanisms are attached via twin mount to same measuring stand. Transition from roughness to contour measurement does not require change in drive device or probe. Simulation modes promote user familiarity, and teach-in commands allow for creation of measuring programs that can be saved and launched using programmable function keys.