Microscopes
Description
Microscopes are instruments, which are used for viewing or investigating small objects that are not visible to the naked eye. Microscopes consist of mirror, objective, condenser, eyepiece, and stage. The specimen to be viewed by the microscope is usually supported by a slide which is placed over a stage. The objective, mirror and condenser are responsible for magnifying the image of the specimen which is viewed by the eyepiece. Microscopes are commonly available in three configurations namely benchtop, student and research. Some of the important specifications to be considered while purchasing microscopes are magnification power, resolution, dimensions, illumination, and objective sizes.
Types
Basically the microscopes are classified into:
Simple microscopes
Compound microscopes
The other common types of microscopes are:
Electron Microscopes
Scanning electron microscopes (SEM)
Transmission electron microscopes (TEM)
Scanning Tunneling Microscopes (STM)
Applications
Some of the broad range of industrial and scientific applications of microscopes is given below:
Used for manufacturing inspection, semiconductor processing, metallurgical analysis and quality control applications
Biological microscopes are used for studying the micro organisms and its vital processes; they are also used for cell research, medical imaging, forensic medicine, and high resolution molecular studies in biological laboratory applications
Used for some specialty applications including gemology and metallurgy
Ideal for professional laboratories and schools
Stereo microscopes are ideal for precision part testing and component assembly in factories
view allRelated Headlines
- How To
null more »
- Industry News
Scientists, photographers and photomicrographers have until April 30th to submit images taken through... more »
- Problem Solvers
When challenged with issues of both performance and price in the design of two video metrology and gagging... more »
- Tech Topics
A sudden demand for bifurcated "smallpox" needles requires transformation of Hobson & Motzer's metrology... more »