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Characterization Tool helps test semiconductors faster


High-speed Model 4200-SCS captures data simultaneously from 2-8 measurement channels, each connected to CV meter, switching matrix, or similar test device. For each channel, optional low-noise preamp provides 0.1 fA resolution. Bundled NT-based software permits point-and-click navigation among test routines, and presents user multiple real-time data plots, automatic sequencing, and built-in test libraries. In sweep mode, it offers 9 forcing functions; in sampling mode, it reads up to 4,096 points, with programmable sampling periods from 1 msec to 1,000 sec. Tool comes with 28 commonly used math functions and constants, plus 26 line fit and parameter extraction functions.

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